Scanning Probe Microscope Laboratory

The NanoVision Scanning Probe Laboratory contains two close loop NT-MDT Ntegra systems for various imaging, manipulation and characterization modes. These include:

• Atomic force microscopy (AFM)
• Scanning tunnelling microscopy (STM)
• Magnetic force microscopy (MFM)
• Electric force microscopy (EFM)
• Adhesion Force Imaging
• AFM Lithography-Force
• Spreading Resistance Imaging (SRI)
• AFM Lithography-Voltage/Scanning Capacitance Imaging (SCI)
• Scanning Kelvin probe microscopy (SKM)
• Scanning Capacitance Microscopy (SCM)
• A range of environmental conditions from -5ºC to 200ºC in liquid, air or vacuum