Analytical EM Laboratory

The FEI Inspect-F is the primary analytical electron microscope for chemical composition work. This includes:

FEI Inspect-F

  • High vacuum FEG source scanning electron microscope (SEM)
  • EDS high speed elemental analysis and mapping
  • WDS high spectral resolution elemental analysis (10eV)
  • EBSD crystallographic texture analysis, grain orientation and mapping
  • Scanning Transmission Electron Microscopy (STEM) in high-vacuum with sub-nanometre resolution

FEI Phenom

  • Rapid optical and SEM imaging to 20,000x magnification
  • Specimen to image time 25s
  • Low vacuum operation for uncoated samples